electron microscopy -凯发官网入口首页

electron microscopy

background:

surface morphology of the materials have great impacts on its performances, and the development of technology calls for more and more precise surface morphology of various materials. scanning electron microscopy (sem) is a common analytical technique for the observation of surface topography. it has high resolution and magnification, big depth of field and large field of vision, imaging of sem is stereoscopic and we can use sem to observe the structures of uneven surfaces of various samples directly. the preparation of samples for sem is simple. equipped with x-ray spectrometer device, the morphology observation and micro area composition analysis can be carried out simultaneously.

by scanning electron microscope, the morphology of the material can be observed, which provides the convenience for the study of the samples’ morphology. and that is helpful to monitor the quality of the product and improve the process.

the main content of the study is to analyze the geometric shape, the particle size, the distribution of the particle size, the structure of the phase and so on.

application range:

material, electronic, metallurgy, aerospace, automobile, geonomy, medicine, machining operation, semiconductor fabrication, ceramic products, etc.

tested flow：

after sputtering pt on surface, the tested samples will be put into sem vacuum chamber to observe and measure according to standard sem operation procedure.

reference standard：

jy/t 010-1996 general rules for analytical scanning electron microscopy

typical pictures: